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BASF focused argon-ion beam (fib) milling
Focused Argon Ion Beam (Fib) Milling, supplied by BASF, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+argon-ion+beam+(fib)+milling/focused+argon+ion+beam++fib++milling/10__1149_slash_1945___7111_slash_ab9187-108-43-32
Average 90 stars, based on 1 article reviews
focused argon-ion beam (fib) milling - by Bioz Stars, 2026-10
90/100 stars

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Microscopy:

Article Title: Novel Method for Monitoring the Electrochemical Capacitance by In Situ Impedance Spectroscopy as Indicator for Particle Cracking of Nickel-Rich NCMs: Part I. Theory and Validation
Article Snippet: Scanning electron microscopy.—The morphology of fresh, mechanically compressed electrodes as well as of the ones harvested and washed after charge/discharge cycling for 0.5, 1.0, and 203.5 cycles was investigated by FIB-SEM at BASF SE (Ludwigshafen, Germany), where the electrodes were cut by focused argon-ion beam (FIB) milling and their cross-sections were investigated by scanning electron microscopy (SEM) in backscattering mode at 10 kV.

Electron Microscopy:

Article Title: Novel Method for Monitoring the Electrochemical Capacitance by In Situ Impedance Spectroscopy as Indicator for Particle Cracking of Nickel-Rich NCMs: Part I. Theory and Validation
Article Snippet: Scanning electron microscopy.—The morphology of fresh, mechanically compressed electrodes as well as of the ones harvested and washed after charge/discharge cycling for 0.5, 1.0, and 203.5 cycles was investigated by FIB-SEM at BASF SE (Ludwigshafen, Germany), where the electrodes were cut by focused argon-ion beam (FIB) milling and their cross-sections were investigated by scanning electron microscopy (SEM) in backscattering mode at 10 kV.



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BASF focused argon-ion beam (fib) milling
Focused Argon Ion Beam (Fib) Milling, supplied by BASF, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/focused+argon-ion+beam+(fib)+milling/focused+argon+ion+beam++fib++milling/10__1149_slash_1945___7111_slash_ab9187-108-43-32
Average 90 stars, based on 1 article reviews
focused argon-ion beam (fib) milling - by Bioz Stars, 2026-10
90/100 stars
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